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IEC 60747-18-4:2023

IEC 60747-18-4:2023

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

Date:
2023-03-16 /Vigente
Idiomas Disponibles:
Inglés
Summary (English):
IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.
Summary (French):
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