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Normas IEC internacionales electrotécnicas - AENOR
IEC 60749-19:2003/AMD1:2010

IEC 60749-19:2003/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 19: Résistance de la pastille au cisaillement

Date:
2010-07-28 /Vigente
Idiomas Disponibles:
Español, Inglés, Bilingüe
Summary (English):
Summary (French):
Relationship with other IEC standards
10,44
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