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Normas IEC internacionales electrotécnicas - AENOR
IEC 60749-23:2004/AMD1:2011

IEC 60749-23:2004/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23: Durée de vie en fonctionnement à haute température

Date:
2011-01-27 /Vigente
Idiomas Disponibles:
Español, Inglés, Bilingüe
Summary (English):
Summary (French):
Relationship with other IEC standards
10,44
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