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Normas IEC internacionales electrotécnicas - AENOR
IEC 60749-27:2006/AMD1:2012

IEC 60749-27:2006/AMD1:2012

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)

Date:
2012-09-25 /Vigente
Idiomas Disponibles:
Inglés, Bilingüe
Summary (English):
Summary (French):
Relationship with other IEC standards
10,44
Language Format

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