IEC 60749-32:2002/AMD1:2010

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 32: Inflammabilité des dispositifs à encapsulation plastique (cas d'une cause extérieure d'inflammation)

Information:

Date:

2010-07-28 /Vigente

Idiomas Disponibles:

Español, Inglés, Bilingüe

Summary (English):

Summary (French):

Relationship with other IEC standards

Modifica a: IEC 60749-32:2002

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