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Normas IEC internacionales electrotécnicas - AENOR
IEC 60749-32:2002/COR1:2003

IEC 60749-32:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 32: Inflammabilité des dispositifs à encapsulation plastique (cas d'une cause extérieure d'inflammation)

Date:
2003-08-13 /Vigente
Idiomas Disponibles:
Bilingüe
Summary (English):
Summary (French):
Relationship with other IEC standards
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