IEC PAS 62175:2000

Marking permanency test method

Information:

Date:

2000-08-24 /Anulada

Idiomas Disponibles:

Inglés

Summary (English):

Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

Summary (French):

Relationship with other IEC standards

Es reemplazada por: IEC 60749-9:2002

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