IEC PAS 62189:2000

Bias Life

Information:

Date:

2000-11-28 /Anulada

Idiomas Disponibles:

Inglés

Summary (English):

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Summary (French):

Relationship with other IEC standards

Es reemplazada por: IEC 60749-23:2004

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