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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62189:2000

IEC PAS 62189:2000

Bias Life

Date:
2000-11-28 /Anulada
Idiomas Disponibles:
Inglés
Summary (English):
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
Summary (French):
Relationship with other IEC standards
20,88
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