IEC 60749-12:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables

Date:

2003-08-13 /Anulada

Idiomas Disponibles:

Bilingüe

Summary (English):

Summary (French):

Relationship with other IEC standards

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