IEC 60749-6:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 6: Stockage à haute température

Date:

2003-08-12 /Anulada

Idiomas Disponibles:

Bilingüe

Summary (English):

Modification of the validity date: now put at 2007.

Summary (French):

Modification de la date de validité : fixée maintenant à 2007.

Relationship with other IEC standards

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