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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62191:2000

IEC PAS 62191:2000

Acoustic microscopy for nonhermetic encapsulated electronic components

Date:
2000-11-28 /Anulada
Idiomas Disponibles:
Inglés
Summary (English):
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.
Summary (French):
Relationship with other IEC standards
83,52
Language Format

Formato digital

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