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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62205:2000

IEC PAS 62205:2000

High temperature storage life

Date:
2000-11-28 /Anulada
Idiomas Disponibles:
Inglés
Summary (English):
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
Summary (French):
Relationship with other IEC standards
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