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Normas IEC internacionales electrotécnicas - AENOR
IEC 60749:1996/AMD1:2000

IEC 60749:1996/AMD1:2000

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods

Amendement 1 - Dispositifs à semiconducteurs - Essais mécaniques et climatiques

Date:
2000-07-31 /Anulada
Idiomas Disponibles:
Español, Bilingüe
Summary (English):
Summary (French):
Relationship with other IEC standards
41,76
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